filename : weyrich06.pdf entry : article conference : SIGGRAPH 2006, Boston, USA, 30 July - 3 August 2006 pages : 1013 - 1024 year : 2006 month : July title : Analysis of Human Faces using a Measurement-Based Skin Reflectance Model subtitle : author : Tim Weyrich, ETH Zurich; Wojciech Matusik, MERL; Hanspeter Pfister, MERL; Bernd Bickel, ETH Zurich; Craig Donner, UC San Diego; Chien Tu, MERL; Janet McAndless, MERL; Jinho Lee, MERL; Addy Ngan, MIT; Henrik Wann Jensen, UC San Diego Markus Gross, ETH Zurich booktitle : ACM Transactions on Graphics, Proceedings of SIGGRAPH 2006 (Conference Issue) ISSN/ISBN : 0730-0301 editor : publisher : ACM Press / ACM SIGGRAPH publ.place : volume : 25 issue : 3 language : English keywords : Modeling - Facial Modeling, Modeling - Object Scanning/Acquisition, Rendering - Reflectance & Shading Models abstract : We have measured 3D face geometry, skin reflectance, and subsurface scattering using custom-built devices for 149 subjects of varying age, gender, and race. We developed a novel skin reflectance model whose parameters can be estimated from the measurements. The model decomposes the high-dimensional BSSRDF of skin into a spatially-varying analytic BRDF, a diffuse albedo map, and diffuse subsurface scattering. Our model is intuitive, physically plausible, amenable to interactive rendering, and easy to edit. High-quality renderings come close to reproducing real photographs. The analysis of the model parameters for our sample population reveals variations according to subject age, gender, skin type, and external factors (e.g., sweat, cold, or makeup). Using our statistics, a user can edit the overall appearance of a face (e.g., changing skin type and age) or change local features using texture synthesis (e.g., adding moles and freckles). We are making the full data set of collected statistics publicly available to the research community for face synthesis, analysis, and editing.