filename : Bic06a.pdf entry : pages : 168 year : 2006 month : August title : Processing and Editing of Faces using a Measurement-Based Skin Reflectance Model subtitle : author : Bernd Bickel, ETH Zurich; Tim Weyrich, ETH Zurich; Wojciech Matusik, MERL; Hanspeter Pfister, MERL; Craig Donner, UC San Diego; Chien Tu, MERL; Janet McAndless, MERL; Jinho Lee, MERL; Addy Ngan, MIT; Henrik Wann Jensen, UC San Diego Markus Gross, ETH Zurich booktitle : SIGGRAPH '06: ACM SIGGRAPH 2006 Sketches ISSN/ISBN : 1-59593-364-6 editor : publisher : ACM Press publ.place : Boston, Massachusetts volume : issue : language : English keywords : abstract : In extension to our paper Analysis of Human Faces using a Measurement-Based Skin Reflectance Model we describe the almost fully automated face processing pipeline including the custom-built acquisition system, calibration procedures, and rendering. The underlying model is intuitive, physically plausible, and allows easy face editing. Generated image quality approaches that of real photographs.